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Suresh Kumar, N.
- Enhanced Classification Algorithms for the Satellite Image Processing
Abstract Views :180 |
PDF Views:0
Authors
N. Suresh Kumar
1,
M. Arun
2
Affiliations
1 School of Computing Science and Engineering, VIT University, Vellore - 632014, IN
2 School of Electronics and Communication Engineering, VIT University, Vellore - 632014, IN
1 School of Computing Science and Engineering, VIT University, Vellore - 632014, IN
2 School of Electronics and Communication Engineering, VIT University, Vellore - 632014, IN
Source
Indian Journal of Science and Technology, Vol 8, No 15 (2015), Pagination:Abstract
Background and objectives: Region based approach to determine the used land details of Vellore district to improvise the vegetation in future. Methods and Statistical Analysis: To classify the used lands Modified KNN and Modified SVM algorithm are applied to get the classification. Accuracy is measured by producer’s accuracy, user’s accuracy, commission error and omission error. Results: MOKNN and MOSVM produce the improved accuracy in classification to determine the exact land use details. Conclusion: Proposed MOKNN and MOSVM give the improved accuracy to predict used land details. This work may be extended with combined data set to get more improved accuracy.Keywords
Classification, Fuzzy, KNN, MOKNN, MOSVM, SVM- PSPICE Simulation of Effect of Ground Bounce in PCB
Abstract Views :175 |
PDF Views:1
Authors
Affiliations
1 Department of Electronics and Communication Engineering, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
2 Department of Information Technology, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
1 Department of Electronics and Communication Engineering, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
2 Department of Information Technology, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
Source
Networking and Communication Engineering, Vol 2, No 8 (2010), Pagination: 221-224Abstract
Now-a-days the demand on the operating speed of the devices with larger number of input/output pins is increasing by leaps and bounds. As the devices become faster, their output switching time decreases and causes the “Ground Bounce”. This effect threatens the operation of high-speed digital systems by causing false triggering and affects the signal integrity. This paper investigates the mechanisms causing ground bounce in PCB by deriving equivalent circuit. The techniques of reducing ground bounce are described.Time domain analysis of ground bounce has been performed for multiple traces using SPICE simulation tool.
Keywords
Signal Integrity, Crosstalk, Simultaneous Switching Noise, Micro Strip, Ground Bounce, SPICE Simulation.- Analysis of High Speed VLSI Interconnects for Signal Integrity in Nanometer Range
Abstract Views :166 |
PDF Views:2
Authors
Affiliations
1 Department of ECE, Velammal College of Engineering and Technology, IN
2 Department of ECE, Mepco Schlenk Engineering College, IN
3 Velammal College of Engineering and Technology, IN
4 Department of ECE, Thiagarajar College of Engineering, IN
1 Department of ECE, Velammal College of Engineering and Technology, IN
2 Department of ECE, Mepco Schlenk Engineering College, IN
3 Velammal College of Engineering and Technology, IN
4 Department of ECE, Thiagarajar College of Engineering, IN
Source
Digital Signal Processing, Vol 2, No 7 (2010), Pagination: 65-69Abstract
The role of interconnects in integrated circuit performances has considerably increased with the technology scale down. Hence interconnect signal integrity becomes much more important, due to the smaller feature sizes and wire pitches. Devices with faster rise and fall times (typically tens of picoseconds) make global interconnects such as clock nets, bus signals, power/ground grids, more vulnerable to signal integrity (SI) degradations. Meanwhile, nanometer process technologies have increased manufacturing and lithography-based distortions of wires, dielectrics, and devices. Starting with the 130nm generation, the interconnect delay began to surpass the intrinsic gate delay. Since most of the delay comes from the IC's interconnect, the tool flow needs accurate interconnect delay information as early as possible and should allow continuous optimization in different stages to correctly reflect the real interconnect delay. The power consumption, performance, signals and power integrity are all affected by the chip interconnect. In addition, minimizing the signal integrity effects such as crosstalk, reflections loss, attenuation, insertion loss, etc., is also a major challenge in the nanometer design. Hence the signal integrity analysis of high-speed electronic designs at nanometer range requires a specific design methodology. In this paper, a single pass SI-aware design methodology is adopted; whose design flow involves three steps. First, the parameters (such as scattering, RLC, Transmission line and near field distributions), which characterize the transmission line structures as interconnect are extracted. Then the frequency range over which the different interconnect structures having minimum losses are found based on the extracted parameters. Next, the nanometer structure selected based on a standard design criterion, is analyzed for various signal integrity effects. Finally, suitable mitigation techniques are adopted so as to eliminate the SI effects.Keywords
Signal Integrity, Transmission Line Structures, SI Effects, Parameter Extraction.- Improvements in Dynamic Web Sites and Analysing User Profile Using Web Mining & Clustering
Abstract Views :185 |
PDF Views:3
Authors
Affiliations
1 Department of Computer Science and Engineering, Raja College of Engineering and Technology, Madurai, Tamilnadu, IN
2 Department of Information Technology, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
3 Department of Electronics and Communication Engineering, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
1 Department of Computer Science and Engineering, Raja College of Engineering and Technology, Madurai, Tamilnadu, IN
2 Department of Information Technology, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
3 Department of Electronics and Communication Engineering, Velammal College of Engineering and Technology, Madurai, Tamilnadu, IN
Source
Data Mining and Knowledge Engineering, Vol 2, No 8 (2010), Pagination: 177-182Abstract
A complete framework and findings are presented in mining web usage patterns from web log files of a real web site that has all the challenging aspects of real-life web usage mining, including evolving user profiles and external data describing anontology of the web content. The behavior of a web site's users may change so quickly that attempting to make predictions, according to the frequent patterns coming from the analysis of an access log file, becomes challenging. In order for the obsolescence of the behavioral patterns to become as possible, the ideal method would provide frequent patterns in real time, allowing the result to be available immediately. Even though the web site under study is part of a nonprofit organization that does not "sell" any products, it was crucial to understand "who" the users Ire, "what" they looked at, and "how their interests changed with time," all of which are important questions in Customer Relationship Management (CRM). Hence, this is a present approach for discovering and tracking evolving user profiles here also describes how the discovered user profiles can be enriched with explicit information need that is inferred from search queries extracted from web log data. An objective validation strategy is also used to assess the quality of the mined profiles, in particular their adaptability in the face of evolving user behavior. In this paper a method allowing to find frequent behavioral patterns in real time, whatever the number of connected users is.- A Study on the Influence of Maternal Factors on Birth Weight
Abstract Views :222 |
PDF Views:0
Authors
Affiliations
1 Nutrition Research Centre, Red Cross Road, Kunnukuzhy P.O., Trivandrum, 37, Kerela, IN
2 Achutha Menon Centre for Health Science Studies, SCTIMST, Trivandrum -11, IN
1 Nutrition Research Centre, Red Cross Road, Kunnukuzhy P.O., Trivandrum, 37, Kerela, IN
2 Achutha Menon Centre for Health Science Studies, SCTIMST, Trivandrum -11, IN
Source
The Indian Journal of Nutrition and Dietetics, Vol 40, No 8 (2003), Pagination: 291-296Abstract
Birth weight is considered to be one of the important and reliable parameters in the evaluation of foetal and neonatal well being. Birth weight below 2.5 kg has been found to be very closely associated with poor growth, not just in infancy but throughout childhood, Low birth weight is associated with the development of coronary heart disease, stroke and diabetes in adult life and malnutrition in early life may affect the developing brain.- Nutrition Awareness, Iodine Deficiency Disorders and Use of Iodated Salts
Abstract Views :176 |
PDF Views:0
Authors
Affiliations
1 Nutrition Research Centre, Red Cross Road, Kunnukuzhi, PO, Trivandrum, IN
1 Nutrition Research Centre, Red Cross Road, Kunnukuzhi, PO, Trivandrum, IN